Product description

               ZEISS XENOS Ultra-High-Precision Coordinate Measuring Machine

               As a new benchmark in the industry, XENOS offers an unimaginable level of overall precision performance, satisfying 

               a wide range of measurement fields that require ultra-high measurement accuracy - from research institutions to metrology 

              science research, aerospace, and optical industries. This top-tier measuring machine achieves measurement accuracy                                                          at the technological limit, with a measurement volume of up to nearly 1 cubic meter.

Technical Features of the System

        Introduction to the Technical Features of ZEISS XENOS:

               Active 3D Continuous Scanning VAST gold Probe System

              The VAST gold probe system is a high-precision three-coordinate measuring system in itself. Compared to traditional single-point trigger probes, it offers advanced technology with self-centering measurement, multi-point touch detection, and continuous scanning capabilities. This is achieved through high-precision inductive displacement sensors that measure minute displacements in the XYZ directions accurately.

        Its unique active design mechanism, coupled with an active force generator, maintains constant measurement force during the measurement process. This enables precise compensation and calculation of minor needle bending, thus satisfying a wide range of regular geometric elements,known and unknown contour three-dimensional high-precision continuous scanning. Additionally, with its larger offset strokes in the XYZ directions, the probe can maximize its influence on the probing behavior during scanning without the need for frequent repositioning of the machine's axes. This effectively improves scanning speed and efficiency. 

Scope of  Applications

              ZEISS XENOS is suitable for various inspection industries, laboratories, research facilities, and other fields. It can measure complex                                      and large-scale components with ultra-high measurement accuracy, meeting a wide range of different measurement requirements.